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All-in-One Report Demo (NSN: 6625008138372, Part Number: 303103)
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Supplier Parts Availability - item details and contact information for suppliers holding stock
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Master Cross Reference Data (MCRD) - alternate part numbers for national stock numbers
NSN
Description
MCRL Information
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6625008138372
PROBE,TEST
INC: 39886
HMIC:
ESDC: P
ENAC:
Cancelled By: |
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Procurement History - US Gov't Purchase History
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DRMS - Government Auction History - (NSN : 6625008138372)
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Description
Event #
Lot #
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Location |
Total Bid |
QTY
#Items in Lot
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Condition
Acquisition
Price
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Lot Title
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PRODTEST
Event: 1285
Lot: 400
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Norfolk VA |
Details Available
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Qty: 9
Items: 50
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A1
Details Available
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LOT (1) TRI-WALL ELECTRICAL EUIP TO INCLUDE:TEST SET SUBASSEMBLY, HANDLE LATCH, TEST SET INSULATION, AMMETER, AMPLIFIER AUDIO, TEST SET CAHTHODE, ADPATER TEST SET, PROBE LEAD ASSEMBLY, MEGONMETER, TEST SIGNAL SOURCE, OSCILLATOR SUBASSEMBLY, TIP TEST PROD, ELECTRONIC VOLTMETER, NULL METER (ALL QUANTITIES ARE APPRXAND BASED ON DRMO COUNTS)
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PRODTEST
Event: 12695
Lot: 900
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Columbus OH |
Details Available
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Qty: 12
Items: 152
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A
Details Available
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1 Tri-wall Electrical Testin Items to include: Agient Technologies Inc, Variable Resistor, P/N 2100-3685; Rockwell Collins Inc, Electrolytic Fixed Capacitor, P/N 248-0012-150; Adaptive Technologies Inc, Semiconductor Device, P/N 2046-108
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PROBETEST
Event: 12850
Lot: 1701
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Groveport OH |
Details Available
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Qty: 12
Items: 59
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A
Details Available
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1 Triwall Electronic/Electrical Testing Items to include: Lockheed Martin Corp., Special Scale Meter, P/N 63A104774P21; Probe Subassembly, P/N 1551AS850-1; Marlow Industries Inc., Indicating Temperature Control, P/N 1041-02
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Technical Characteristics - detailed information such as measurements and material type for national stock numbers
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NSN
Item Name |
Technical Characteristics |
6625-008138372
PROBE,TEST |
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Management Data - US Gov't supply management data (costs, storage, etc.)
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NSN
Item Name |
Management Data |
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6625-008138372
PROBE,TEST
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| PMIC |
Criticality |
ADPE |
ESDC |
HMIC |
DEML |
| U |
X |
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P |
A |
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